Infrared emissivity measurement device: principle and applications
Ibos, Laurent, Marchetti, Mario, Boudenne, Abderrahim, Datcu, Stefan, Candau, Yves, Livet, JeanVolume:
17
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/17/11/013
Date:
November, 2006
File:
PDF, 402 KB
english, 2006