A Self-Amplifying Four-Transistor MOSFET Mismatch Test...

IEEE Transactions on Semiconductor Manufacturing 2013 / 08 Vol. 26; Iss. 3

A Self-Amplifying Four-Transistor MOSFET Mismatch Test Structure

McAndrew, Colin C., Zunino, Mike, Braswell, Brandt
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Volume:
26
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2013.2257896
Date:
August, 2013
File:
PDF, 562 KB
english, 2013
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