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[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Efficient fault simulation through dynamic binary translation for dependability analysis of embedded software
Di Guglielmo, Giuseppe, Ferraretto, Davide, Fummi, Franco, Pravadelli, GrazianoYear:
2013
Language:
english
DOI:
10.1109/ETS.2013.6569351
File:
PDF, 453 KB
english, 2013