![](/img/cover-not-exists.png)
Quantum Metrology with a Scanning Probe Atom Interferometer
Ockeloen, Caspar F., Schmied, Roman, Riedel, Max F., Treutlein, PhilippVolume:
111
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/PhysRevLett.111.143001
Date:
October, 2013
File:
PDF, 773 KB
english, 2013