Microscopic origins of electron and hole stability in ZnO

Chemical Communications 2011 Vol. 47; Iss. 12

Microscopic origins of electron and hole stability in ZnO

Catlow, C. Richard A., Sokol, Alexey A., Walsh, Aron
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
47
Year:
2011
Language:
english
Journal:
Chemical Communications
DOI:
10.1039/C1CC10314H
File:
PDF, 238 KB
english, 2011
Conversion to is in progress
Conversion to is failed