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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy
Shamshiri, Saeed, Cheng, Kwang-TingYear:
2010
Language:
english
DOI:
10.1109/VTS.2010.5469579
File:
PDF, 908 KB
english, 2010