X-ray diffraction study of the bonding between sulphur and...

X-ray diffraction study of the bonding between sulphur and the elements of group IVB. The crystal and molecular structures of methylthiotriphenyl-methane, -silicon, -germanium, -tin and -lead

G.D. Andreetti, G. Bocelli, G. Calestani, P. Sgarabotto
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Volume:
273
Year:
1984
Language:
english
Pages:
15
DOI:
10.1016/0022-328x(84)80504-5
File:
PDF, 820 KB
english, 1984
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