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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering XI - Decoupling sparse coding of SIFT descriptors for large-scale visual recognition
Ji, Zhengping, Theiler, James, Chartrand, Rick, Kenyon, Garrett, Brumby, Steven P., Szu, Harold H.Volume:
8750
Year:
2013
Language:
english
DOI:
10.1117/12.2018204
File:
PDF, 3.37 MB
english, 2013