[IEEE 2013 IEEE ECCE Asia Downunder (ECCE Asia 2013) -...

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[IEEE 2013 IEEE ECCE Asia Downunder (ECCE Asia 2013) - Melbourne, VIC (2013.6.3-2013.6.6)] 2013 IEEE ECCE Asia Downunder - Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications

Santini, Thomas, Sebastien, Morand, Florent, Miller, Phung, Luong-Viet, Allard, Bruno
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Year:
2013
Language:
english
DOI:
10.1109/ECCE-Asia.2013.6579125
File:
PDF, 1.17 MB
english, 2013
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