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[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy ()] 2006 IEEE International Conference on IC Design and Technology - Reliability of Ultra Thin Gate Oxide CMOS Devices: Design Perspective
Parthasarathy, C.R., Denais, M., Huard, V., Ribes, G., Vincent, E., Bravaix, A.Year:
2006
Language:
english
DOI:
10.1109/ICICDT.2006.220808
File:
PDF, 8.01 MB
english, 2006