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[IEEE 2013 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2013.01.28-2013.01.31)] 2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) - Condition-based replacement policy for a device using interval-censored inspection data
Moghaddass, Ramin, Zuo, Ming JYear:
2013
Language:
english
DOI:
10.1109/RAMS.2013.6517680
File:
PDF, 723 KB
english, 2013