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Current Instability, Permittivity Variation With Frequency, and Their Relationship in $\hbox{Ta}_{2}\hbox{O}_{5}$ Capacitor
Manceau, Jean-Philippe, Bruyere, Sylvie, Jeannot, Simon, Sylvestre, Alain, Gonon, PatriceVolume:
7
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2007.901086
Date:
June, 2007
File:
PDF, 368 KB
english, 2007