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SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] X-Ray/EUV Optics for Astronomy and Microscopy - X-Ray/EUV Multilayers: Promise And Pitfalls
Harvey, James E., Zmek, William P., Moran, Edward C., Hoover, Richard B.Volume:
1160
Year:
1989
Language:
english
DOI:
10.1117/12.962643
File:
PDF, 634 KB
english, 1989