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[IEEE 2008 IEEE 17th Conference on Electrical Performance of Electronic Packaging (EPEP) - San Jose, CA, USA (2008.10.27-2008.10.29)] 2008 IEEE-EPEP Electrical Performance of Electronic Packaging - Measurement techniques for on-chip power supply noise waveforms based on fluctuated sampling delays in inverter chain circuits
Uematsu, Yutaka, Osaka, Hideki, Suzuki, Eiichi, Yagyu, Masayoshi, Saito, TatsuyaYear:
2008
Language:
english
DOI:
10.1109/EPEP.2008.4675879
File:
PDF, 3.39 MB
english, 2008