IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications
2011 / 06 Vol. 58; Iss. 6
Pathological Element-Based Active Device Models and Their Application to Symbolic Analysis
Sanchez-Lopez, Carlos, Fernandez, Francisco V., Tlelo-Cuautle, Esteban, Tan, Sheldon X.-D.Volume:
58
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/TCSI.2010.2097696
Date:
June, 2011
File:
PDF, 2.14 MB
english, 2011