Two-dimensional imaging of cleaved Si p-n junctions with...

IEEE Electron Device Letters 1991 / 08 Vol. 12; Iss. 8

Two-dimensional imaging of cleaved Si p-n junctions with 30-nm resolution using a UHV scanning tunneling microscope

Kordic, S., van Loenen, E.J., Walker, A.J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
12
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.119152
Date:
August, 1991
File:
PDF, 412 KB
english, 1991
Conversion to is in progress
Conversion to is failed