[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - A reliability-aware RF power amplifier design for CMOS radio chip integration
Ruberto, Mark, Degani, Ofir, Wail, Shay, Tendler, Alex, Fridman, Amir, Goltman, GennadyYear:
2008
Language:
english
DOI:
10.1109/RELPHY.2008.4558942
File:
PDF, 329 KB
english, 2008