![](/img/cover-not-exists.png)
[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Channel width and length dependent flicker noise characterization for n-MOSFETs
Aoki, H., Shimasue, M.Year:
2001
Language:
english
DOI:
10.1109/ICMTS.2001.928672
File:
PDF, 365 KB
english, 2001