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[IEEE 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Minneapolis, MN (2013.05.6-2013.05.9)] 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Split ADC background self-calibration of a 16-b successive approximation ADC in 180nm CMOS
McNeill, John, David, Christopher, Coln, Michael C. W., Ka Yan Chan,Year:
2013
Language:
english
DOI:
10.1109/I2MTC.2013.6555430
File:
PDF, 3.00 MB
english, 2013