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SPIE Proceedings [SPIE 1980 European Conference on Optical Systems and Applications - Utrecht, Netherlands (Tuesday 23 September 1980)] 1980 European Conf on Optical Systems and Applications - Absorption-Interferometric Technique For Mapping Temperature And Concentration Profiles During Crystal Growth From Solution
Shlichta, Paul J., Kroon, D. J.Volume:
236
Year:
1981
Language:
english
DOI:
10.1117/12.958992
File:
PDF, 218 KB
english, 1981