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[IEEE 2012 IEEE International Symposium on Electromagnetic Compatibility - EMC 2012 - Pittsburgh, PA, USA (2012.08.6-2012.08.10)] 2012 IEEE International Symposium on Electromagnetic Compatibility - PCB conductor surface roughness as a layer with effective material parameters
Koledintseva, Marina Y., Razmadze, Alexander G., Gafarov, Aleksandr Y., De, Soumya, Drewniak, James L., Hinaga, ScottYear:
2012
Language:
english
DOI:
10.1109/ISEMC.2012.6351795
File:
PDF, 1.11 MB
english, 2012