Improved controlled atmosphere high temperature scanning probe microscope
Hansen, K. V., Wu, Y., Jacobsen, T., Mogensen, M. B., Theil Kuhn, L.Volume:
84
Year:
2013
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4811848
File:
PDF, 1.68 MB
english, 2013