SPIE Proceedings [SPIE 5th International Symposium on...

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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Photoluminescence investigation of InAs quantum dots in quantum well with different strain reducing layer

Kong, Lingmin, Zhou, Yunqing, Wang, Rui, Zhang, Cunxi, Yao, Jianming, Wang, Shilai, Cai, Jiafa, Wu, Zhengyun, Jiang, Ya-Dong, Kippelen, Bernard, Yu, Junsheng
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Volume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.864046
File:
PDF, 236 KB
english, 2010
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