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[IEEE 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) - Osaka (2013.7.3-2013.7.7)] 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) - Robust classification of DNA damage patterns in single cell gel electrophoresis
Taehoon Lee,, Sungmin Lee,, Woo Young Sim,, Yu Mi Jung,, Sunmi Han,, Chanil Chung,, Chang, Jay Junkeun, Hyeyoung Min,, Sungroh Yoon,Year:
2013
Language:
english
DOI:
10.1109/EMBC.2013.6610338
File:
PDF, 4.37 MB
english, 2013