New Reliability-Based Robust Design Optimization Algorithms...

IEEE Transactions on Magnetics 2013 / 05 Vol. 49; Iss. 5

New Reliability-Based Robust Design Optimization Algorithms for Electromagnetic Devices Utilizing Worst Case Scenario Approximation

Ren, Ziyan, Zhang, Dianhai, Koh, Chang-Seop
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Volume:
49
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/TMAG.2013.2238906
Date:
May, 2013
File:
PDF, 758 KB
english, 2013
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