Input Test Data Compression Based on the Reuse of Parts of...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2013 / 11 Vol. 32; Iss. 11

Input Test Data Compression Based on the Reuse of Parts of Dictionary Entries: Static and Dynamic Approaches

Sismanoglou, Panagiotis, Nikolos, Dimitris
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Volume:
32
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2013.2270433
Date:
November, 2013
File:
PDF, 17.17 MB
english, 2013
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