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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Document Recognition and Retrieval XX - Evaluation of document binarization using eigen value decomposition
Kumar, Deepak, Anil Prasad, M. N., Ramakrishnan, A. G., Zanibbi, Richard, Coüasnon, BertrandVolume:
8658
Year:
2013
Language:
english
DOI:
10.1117/12.2008502
File:
PDF, 186 KB
english, 2013