Surface and Thin Film Analysis (A Compendium of Principles, Instrumentation, and Applications) || X-Ray Photoelectron Spectroscopy (XPS)
Friedbacher, Gernot, Bubert, HenningYear:
2011
Language:
english
DOI:
10.1002/9783527636921.ch2
File:
PDF, 409 KB
english, 2011