[IEEE 2010 75th ARFTG Microwave Measurement Conference - Anaheim, CA, USA (2010.05.28-2010.05.28)] 75th ARFTG Microwave Measurement Conference - S-functions behavioral model order reduction based on narrowband modulated large-signal network analyzer measurements
Myslinski, Maciej, Verbeyst, Frans, Vanden Bossche, Marc, Schreurs, DominiqueYear:
2010
Language:
english
DOI:
10.1109/ARFTG.2010.5496321
File:
PDF, 734 KB
english, 2010