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[IEEE 2010 75th ARFTG Microwave Measurement Conference -...

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[IEEE 2010 75th ARFTG Microwave Measurement Conference - Anaheim, CA, USA (2010.05.28-2010.05.28)] 75th ARFTG Microwave Measurement Conference - S-functions behavioral model order reduction based on narrowband modulated large-signal network analyzer measurements

Myslinski, Maciej, Verbeyst, Frans, Vanden Bossche, Marc, Schreurs, Dominique
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Year:
2010
Language:
english
DOI:
10.1109/ARFTG.2010.5496321
File:
PDF, 734 KB
english, 2010
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