Quantitative electron microprobe analysis of thin films on...

Quantitative electron microprobe analysis of thin films on substrates with a new Monte Carlo simulation

Murata, Kenji, Kotera, Masatoshi, Nagami, Koichi
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Volume:
54
Year:
1983
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.332127
File:
PDF, 536 KB
english, 1983
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