Fermi-Level Pinning Induced Thermal Instability in the...

IEEE Electron Device Letters 2004 / 03 Vol. 25; Iss. 3

Fermi-Level Pinning Induced Thermal Instability in the Effective Work Function of TaN in<tex>$hbox TaN/SiO_2$</tex>Gate Stack

Ren, C., Yu, H.Y., Kang, J.F., Hou, Y.T., Li, M.-F., Wang, W.D., Chan, D.S.H., Kwong, D.-L.
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Volume:
25
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2004.824251
Date:
March, 2004
File:
PDF, 146 KB
english, 2004
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