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Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)
Pease, R.L., Gehlhausen, M., Krieg, J., Titus, J., Turflinger, T., Emily, D., Cohn, L.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.736512
Date:
January, 1998
File:
PDF, 845 KB
english, 1998