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[IEEE 2010 IEEE 23rd International Conference on Micro Electro Mechanical Systems (MEMS) - Wanchai, Hong Kong, China (2010.01.24-2010.01.28)] 2010 IEEE 23rd International Conference on Micro Electro Mechanical Systems (MEMS) - Factors affecting degradation of sputtered iridium oxide used for neuroprosthetic applications
Negi, Sandeep, Bhandari, Rajmohan, Van Wagenen, Rick, Solzbacher, FlorianYear:
2010
Language:
english
DOI:
10.1109/MEMSYS.2010.5442438
File:
PDF, 590 KB
english, 2010