[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - OLED Device Operational Lifetime: Insights and Challenges
Xia, Sean C., Kwong, Raymond C., Adamovich, Vadim I., Weaver, Michael S., Brown, Julie J.Year:
2007
Language:
english
DOI:
10.1109/RELPHY.2007.369901
File:
PDF, 5.51 MB
english, 2007