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ECE imaging of electron temperature and electron temperature fluctuations (invited)
Deng, B. H., Domier, C. W., Luhmann, N. C., Brower, D. L., Cima, G., DonneÌ, A. J. H., Oyevaar, T., van de Pol, M. J.Volume:
72
Year:
2001
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1319864
File:
PDF, 757 KB
english, 2001