Use of atomic force microscopy (AFM) to explore cell wall properties and response to stress in the yeastSaccharomyces cerevisiae
Francois, Jean Marie, Formosa, Cécile, Schiavone, Marion, Pillet, Flavien, Martin-Yken, Hélène, Dague, EtienneVolume:
59
Language:
english
Journal:
Current Genetics
DOI:
10.1007/s00294-013-0411-0
Date:
November, 2013
File:
PDF, 511 KB
english, 2013