Use of atomic force microscopy (AFM) to explore cell wall...

Use of atomic force microscopy (AFM) to explore cell wall properties and response to stress in the yeastSaccharomyces cerevisiae

Francois, Jean Marie, Formosa, Cécile, Schiavone, Marion, Pillet, Flavien, Martin-Yken, Hélène, Dague, Etienne
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Volume:
59
Language:
english
Journal:
Current Genetics
DOI:
10.1007/s00294-013-0411-0
Date:
November, 2013
File:
PDF, 511 KB
english, 2013
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