[IEEE International Electron Devices Meeting. IEDM...

  • Main
  • [IEEE International Electron Devices...

[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Physical oxide thickness extraction and verification using quantum mechanical simulation

Bowen, C., Fernando, C.L., Klimeck, G., Chatterjee, A., Blanks, D., Lake, R., Hu, J., Davis, J., Kulkarni, M., Hattangady, S., Chen, I.-C.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
1997
Language:
english
DOI:
10.1109/IEDM.1997.650518
File:
PDF, 371 KB
english, 1997
Conversion to is in progress
Conversion to is failed