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[IEEE 2009 International Microwave Workshop Series on Signal Integrity and High-Speed Interconnects (IMWS) - Guadalajara, Mexico (2009.02.19-2009.02.20)] 2009 International Microwave Workshop Series on Signal Integrity and High-Speed Interconnects - Impact of ULK Dielectric Loss on Interconnect Response for 45 nm Node Integrated Circuits

de Rivaz, S., Lacrevaz, T., Gallitre, M., Farcy, A., Blampey, B., Bermond, C., Flechet, B.
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Year:
2009
Language:
english
DOI:
10.1109/IMWS.2009.4814921
File:
PDF, 2.70 MB
english, 2009
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