SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV - Large format resistive array scene simulation validation testing and readiness
Oleson, Jim, Cordell, John, Greer, Derek, Joyner, Tom, Woode, Brian, Buford, Jr., James A., Murrer, Jr., Robert LeeVolume:
7663
Year:
2010
Language:
english
DOI:
10.1117/12.852648
File:
PDF, 2.82 MB
english, 2010