![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV - Fast methods for computing scene raw signals in millimeter-wave sensor simulations
Olson, Richard F., Reynolds, Terry M., Satterfield, H. Dewayne, Buford, Jr., James A., Murrer, Jr., Robert LeeVolume:
7663
Year:
2010
Language:
english
DOI:
10.1117/12.853466
File:
PDF, 1.27 MB
english, 2010