[IEEE 2010 First International Conference on Sensor Device...

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[IEEE 2010 First International Conference on Sensor Device Technologies and Applications (SENSORDEVICES) - Venice, Italy (2010.07.18-2010.07.25)] 2010 First International Conference on Sensor Device Technologies and Applications - Numerical Simulation of Multi-path Ultrasonic Flowmeter: Ultrasonic Path Error Analysis

Fei, Liu, Cunfu, He, Bin, Wu, Jingpin, Jiao
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Year:
2010
Language:
english
DOI:
10.1109/SENSORDEVICES.2010.18
File:
PDF, 600 KB
english, 2010
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