Raman Analysis of Microscopic Residual Stresses Stored in...

Raman Analysis of Microscopic Residual Stresses Stored in the Secondary Phase of Sc2O3-Doped Si3N4

Tochino, Shigemi, Pezzotti, Giuseppe
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Volume:
287
Year:
2005
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.287.427
File:
PDF, 395 KB
english, 2005
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