SPIE Proceedings [SPIE International Conference on Applied Optical Metrology - Balatonfured, Hungary (Monday 8 June 1998)] International Conference on Applied Optical Metrology - Numerical simulation package for speckle metrology
Kornis, Janos, Bokor, Nandor, Nemeth, Attila, Rastogi, Pramod K., Gyimesi, FerencVolume:
3407
Year:
1998
Language:
english
DOI:
10.1117/12.323328
File:
PDF, 3.01 MB
english, 1998