Capabilities of Femtosecond Laser Ablation Inductively Coupled Plasma Mass Spectrometry for Depth Profiling of Thin Metal Coatings
Pisonero, J., Koch, J., Wälle, M., Hartung, W., Spencer, N. D., Günther, D.Volume:
79
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac062027s
Date:
March, 2007
File:
PDF, 1.32 MB
english, 2007