Control of tip-to-sample distance in atomic force...

Review of Scientific Instruments 2007 Vol. 78; Iss. 9

Control of tip-to-sample distance in atomic force microscopy: A dual-actuator tip-motion control scheme

Jeong, Younkoo, Jayanth, G. R., Menq, Chia-Hsiang
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Volume:
78
Year:
2007
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2785158
File:
PDF, 684 KB
english, 2007
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