An experimental UHV AFM-STM device for characterizing...

Review of Scientific Instruments 2013 Vol. 84; Iss. 10

An experimental UHV AFM-STM device for characterizing surface nanostructures under stress∕strain at variable temperature

Nahas, Y., Berneau, F., Bonneville, J., Coupeau, C., Drouet, M., Lamongie, B., Marteau, M., Michel, J., Tanguy, P., Tromas, C.
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Volume:
84
Year:
2013
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4826555
File:
PDF, 1.67 MB
english, 2013
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