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SPIE Proceedings [SPIE AeroSense 2003 - Orlando, FL (Monday 21 April 2003)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII - Maximizing performance of real-time CHAMP (RTC) for hardware-in-the-loop (HITL) testing
Lashley, Tony C., Crow, Dennis R., Murrer, Jr., Robert LeeVolume:
5092
Year:
2003
Language:
english
DOI:
10.1117/12.512652
File:
PDF, 49 KB
english, 2003