SPIE Proceedings [SPIE AeroSense 2003 - Orlando, FL (Monday 21 April 2003)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII - Infrared projector flood nonuniformity correction characteristics
Joyce, Robert A., Swierkowski, Leszek, Williams, Owen M., Murrer, Jr., Robert LeeVolume:
5092
Year:
2003
Language:
english
DOI:
10.1117/12.486897
File:
PDF, 861 KB
english, 2003