SPIE Proceedings [SPIE AeroSense 2003 - Orlando, FL (Monday 21 April 2003)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII - Array nonuniformity correction: new procedures designed for difficult measurement conditions
Sieglinger, Breck A., Norman, James D., Meshell, William M., Flynn, David S., Thompson, Rhoe A., Goldsmith II, George C., Murrer, Jr., Robert LeeVolume:
5092
Year:
2003
Language:
english
DOI:
10.1117/12.488620
File:
PDF, 504 KB
english, 2003