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SPIE Proceedings [SPIE AeroSense 2002 - Orlando, FL (Monday 1 April 2002)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII - Advanced flood nonuniformity correction for emitter array infrared projectors
Swierkowski, Leszek, Williams, Owen M., Murrer, Jr., Robert LeeVolume:
4717
Year:
2002
Language:
english
DOI:
10.1117/12.474712
File:
PDF, 706 KB
english, 2002